BS EN 60749-36:2003
British Standards Institute, BSI

BSI Standards
BS EN 60749-36:2003 is available to buy as a BSI Standard from the Tosca Document Shop. If you wish to purchase BS EN 60749-36:2003 from the Tosca Document Shop click below on the appropriate button.
BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods. Acceleration, steady state
PDF Download: £64.00
0 580 42065 5
Pages:
8
BS EN 60749-36:2003 International Equivalent:
EN 60749-36:2003 IEC 60749-36:2003
BS EN 60749-36:2003 Key Phrases:
Semiconductor devices, Integrated circuits, Electronic equipment and components, Mechanical testing, Environmental testing, Climate, Acceleration measurement, Acceleration tests, Impact testing, Destructive testing, Endurance testing, Stress
BS EN 60749-36:2003 Cross References:
IEC 60068-2-7, EN 60068-2-7:1993
BS EN 60749-36:2003 Replaces:
BS EN 60749:1999

BS EN 60749-36:2003
British Standards Institute, BSI

BSI Standards
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